GOEPEL electronic unveils SCANFLEX II CUBE achievable generation JTAG/Boundary Scan Controller

GOEPEL electronic presents SCANFLEX II CUBE, the latest generation of modular JTAG/Boundary Scan controllers.? In line with the latest multi-core processors and FPGAs, SCANFLEX II CUBE opens new methods of the Embedded JTAG Solutions. This ensure that you validation method uses embedded instruments to check and program complex boards. This provides a high test depth with less by using external test hardware.

The multifunctional architecture in the SCANFLEX II CUBE allows users combine numerous technologies flexibly sufficient reason for high performance on a single platform. Embedded Board Test affords the benefit for an extremely improved test depth for complex boards even without the dependence on needles. One example is, an Embedded Functional Test is usually implemented while Embedded Programming makes external programmers unnecessary.

Eight independent, parallel test access ports (TAPs) for 100MHz enable synchronized execution of test, debug and programming operations via Embedded JTAG Solutions (Boundary Scan, Processor Emulation, Chip Embedded Instruments). SCANFLEX II CUBE are usually controlled via USB 3.0 and Gbit LAN

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